Evaluation of the Safety and Efficacy of Transcatheter Closure of Perimembranous Ventricular Septal Defects with a Single Device Type: A Single-Centre Experience.

Background/Objective: Ventricular septal defect (VSD) is the most common congenital heart anomaly, with the perimembranous subtype (pmVSD) being among the most prevalent forms. Surgical repair remains the gold standard for treatment; however, percutaneous closure has emerged as a promising alternative due to the availability of various occlusion devices. Each technique presents distinct advantages and limitations, particularly in terms of complications and long-term outcomes. We sought to evaluate the safety and mid-term outcomes of pmVSD closure employing the Nit-Occlud® Le VSD Coil within a single-centre, single-team setting. Methods: Of the 55 patients hospitalised for pmVSD closure, 45 children underwent the procedure with the Nit-Occlud® Le VSD device. Relevant clinical and defect-related data were collected during hospitalisation and throughout follow-up. Results: Among 45 patients, successful coil implantation was achieved in 41 cases (91.1%). Periprocedural complications occurred in 8 patients (17.8%), including haemolysis, transient atrioventricular block, aortic valve injury, transient ST-segment elevation and supraventricular tachycardia. Two of these complications (4.4%) were classified as severe. The occurrence of complications was significantly associated with the type of VSD shunt (p = 0.03). Conclusions: Transcatheter closure of pmVSD using the Nit-Occlud® Lê VSD Coil in young children is a feasible and safe option with careful patient selection. Patients with type C pmVSD appear to benefit the most. Nevertheless, potential complications, including haemolysis and aortic valve injury, require close monitoring.