Physical and chemical characterization of beryllium particles from several workplaces in Québec, Canada--part B: time-of-flight secondary-ion mass spectroscopy.

The problems associated with detecting and characterizing beryllium (Be) particles in industrial samples from Québec were addressed in the companion article (Rouleau et al., 2005). The present study is a continuation of the work aimed at redefining the current occupational exposure level for beryllium. The goals were to determine the principal chemical forms and the principal physical characteristics of Be particles sampled in four Québec industries. Bulk particle chemistry was determined using inductively coupled plasma-mass spectroscopy (ICP-MS) and flame atomic absorption spectrophotometry (FAAS). Time-of-flight secondary-ion mass spectroscopy (TOF-SIMS) was used to characterize particle surface chemistry and physical particle size. The dust samples collected had Be concentrations varying from 58 to 146 microg/g. Results showed that numerous fine Be particles or aggregates were evenly dispersed throughout the samples. Thus, Be does not appear to be concentrated in large particles. However, it was not possible to confirm if these fine particles were combined to specific compounds, chemically or physically, or independent Be particles. Most of the particles containing Be were fine, with diameters less than 10 microm, which is important from an occupational health and safety standpoint. TOF-SIMS should be considered as an appropriate technique for qualitative characterization of Be particles, and a valuable complement to the recognized quantitative methods ICP-MS and FAAS.