Development and validation of an interface for automated image acquisition during high-temperature environmental scanning electron microscopy experiments.

An interface that enables automatic image acquisition during high-temperature experiments in an environmental SEM is developed. It is optimized to work on multiple regions of interest at multiple magnifications, performing image focusing (focus and astigmatism) and automatic re-centering of regions of interest. Its operation has been validated by monitoring two regions of interest of a nickel-based superalloy undergoing oxidation at 950 °C at different magnifications. Recording series of images at different magnifications on different regions of interest makes it possible to qualify the behavior of different areas of the sample in a single operation and/or to validate the reproducibility of the observations.