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DOI 10.1016/j.jacep.2017.07.012

Медицинская библиотека · JACC. Clinical electrophysiology · 2017

Risk of Collateral Lead Damage in Percutaneous Cardiac Implantable Electronic Device Extraction.

Khan Faris, Sverin Gustaf, Birgersdotter-Green Ulrika, Miller Jennifer P, Lalani Gautam, Pollema Travis, Pretorius Victor

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Аннотация

OBJECTIVES

This study sought to assess the risk of collateral lead damage during cardiac implantable electronic device extraction.

BACKGROUND

With the increasing numbers of cardiovascular implantable electronic devices, there has been an increase in the number of percutaneous device and lead extractions. It is unknown how often collateral damage (defined as the need for unintended lead extraction, or loss of lead's integrity or dislodgement) occurs in the planned retained leads.

METHODS

In this retrospective study, 108 patients who underwent incomplete cardiovascular implantable electronic device removal at the University of California, San Diego from September 2010 to September 2015 were included. The authors established the integrity of previously functioning leads at the end of each procedure as well as on follow-up visits using parameters including lead impedance change, threshold change, drop in P- or R-wave signal amplitude, or presence of lead noise.

RESULTS

Only 4 of 143 leads (2.7%) were found to have collateral damage. One right atrial (RA) lead had a clear insulation break, the second RA lead was found dislodged, and the third RA had a constant noise. The right ventricular lead was found to have a new high pacing threshold. Collateral lead age, extracted lead implantation site, collateral lead implantation site, and mode of lead extraction (laser, traction, or rotational dilator) did not have a significant correlation with the outcome of collateral lead damage.

CONCLUSIONS

Lead extraction can be performed safely; however, there is a small risk of damaging adjacent leads. Close follow-up is needed, especially for the first few months, to assess for the reconnected leads' integrity.

Для цитирования: Khan Faris, Sverin Gustaf, Birgersdotter-Green Ulrika, Miller Jennifer P, Lalani Gautam, Pollema Travis, Pretorius Victor. Risk of Collateral Lead Damage in Percutaneous Cardiac Implantable Electronic Device Extraction.. JACC. Clinical electrophysiology. 2017. DOI: 10.1016/j.jacep.2017.07.012.

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