DOI 10.1016/j.burns.2025.107519
Role of DLAT in cuproptosis and autophagy in hippocampal tissue of PTSD rats with high-voltage electrical burns.
Аннотация
BACKGROUND
The mechanisms behind high-voltage electrical burn (HVEB)-induced post-traumatic stress disorder (PTSD) remain unclear. Accordingly, we aimed to identify the molecular changes in hippocampal tissue following HVEB-induced PTSD.
METHODS
The GSE60303 dataset was used to identify differentially expressed cuproptosis-related genes (DE-CRGs) and to perform weighted gene co-expression network analysis. A core gene and associated genes were identified, followed by enrichment analysis. Additionally, a rat model of HVEB PTSD was established, and behavioral tests were conducted. Histological assessments and the evaluation of related protein and gene expression levels were performed on hippocampal tissue.
RESULTS
Twelve DE-CRGs were identified in the hippocampal tissue of PTSD rats, with DLAT identified as the core gene. Analysis of DLAT-associated genes revealed enrichment in the cAMP signaling pathway and autophagy. Behavioral tests confirmed that HVEB induced PTSD-like behavior in rats. DLAT expression was decreased in the hippocampal tissue of HVEB PTSD rats, accompanied by changes in the expression of cuproptosis, cAMP pathway, and autophagy-related genes.
CONCLUSION
DLAT is reduced in the hippocampal tissue of HVEB PTSD rats. The downregulation of DLAT may contribute to the development of PTSD-like behaviors in HVEB rats by promoting cuproptosis, activating the cAMP pathway, and enhancing autophagy.
Предметные рубрики MeSH
Подготовка и перевод публикации
Обработка статьи · этапы, ошибки и управление
Ошибки и ограничения
История · было → стало
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