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Science advances · 2026

Van der Waals template-encoded soft epitaxy of tellurium enabled by atomic layer deposition.

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Kim Changhwan, Cho Hyeon, Shi Chuqiao, Jang Mingyu, Zhu Wenxuan, Im Subin, Choi Minhyuk, Lee Gayeon, Yang Seonguk, Li Xinyan, Hur Namwook, Kim Miso, Nandi Srinibas, Erdi Melike, Motamarri Phani, Lee Seung-Cheol, Bhattacharjee Satadeep, Tongay Seth Ariel, Song Seungwoo, Park Tae-Eon, Han Yimo, Shong Bonggeun, Suh Joonki

Аннотация

Van der Waals (vdW) epitaxy can integrate lattice-mismatched crystals with atomically sharp, pristine interfaces. However, translating this concept to atomic layer deposition (ALD), a standard for low-temperature, layer-by-layer growth, remains challenging because precursors adsorb transiently on chemically inert vdW basal planes, leading to physisorption-limited nucleation and poor crystalline ordering. Here, we introduce diffusion-steered epitaxial ALD (Epi-ALD), redefining vdW surfaces as programmable kinetic-thermodynamic landscapes and demonstrate highly crystalline tellurium at 150°C. Epi-ALD couples surface-potential-encoded physisorption with long-range diffusion to promote ordered nucleation and epitaxial alignment. This "soft" pathway enables strain-free tellurium epitaxy with a pristine vdW gap (∼1.4 angstrom) despite lattice mismatch (>3.6%) and generalizes across multiple vdW templates. Retaining hallmark advantages of ALD including scalability and uniformity, we further program in-plane orientation through vdW symmetry engineering to achieve quasi-single-crystalline tellurium films with pronounced anisotropy and a chiral anomaly signature. Our work establishes a universal, low-thermal-budget approach for integrating vdW materials and expands the scope of epitaxy within the ALD paradigm.

ИП Урсолов Владлен Сергеевич

ИНН 500118482352 · ОГРНИП 314500117700049

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