A cryogenic characterization platform for commercial off-the-shelf (COTS) electronic devices in liquid xenon detectors for high-energy physics experiments.

The increasing deployment of cryogenic noble-liquid detectors in high-energy physics experiments has created a growing demand for reliable qualification methods for electronic components operating at temperatures beyond their specified ranges. However, the operating temperature range specified for commercial off-the-shelf electronic components typically does not extend to cryogenic temperatures, leaving their low-temperature characteristics insufficiently characterized and introducing uncertainties in detector electronics design. This study presents a versatile cryogenic characterization platform that enables systematic qualification of commercial electronic components under detector-relevant operating conditions. The platform provides a stable temperature environment centered at 165 K, corresponding to liquid xenon detector operation, while maintaining the relative humidity below 15% to minimize condensation-related failures. Furthermore, an FPGA-based digital electronics subsystem was developed to support device evaluation, with its key functional modules individually qualified to ensure reliable operation at 165 K before system-level integration. The platform was used to evaluate the performance of an ADI ADS52J65 analog-to-digital converter (ADC) and to characterize the cryogenic behavior of a Hamamatsu S13370 silicon photomultiplier (SiPM). Both devices operated reliably at 165 K. The ADC achieved a signal-to-noise ratio of ∼64 dB with a near-full-scale 1.1 MHz sinusoidal input, while the dark count rate of the SiPM was reduced to below 1 Hz. This study demonstrates a practical platform for the cryogenic characterization of front-end electronic devices intended for liquid xenon detectors. By combining a controlled cryogenic environment with a qualified digital electronics subsystem, the platform provides a reusable experimental infrastructure for evaluating commercial electronic components under cryogenic operating conditions and offers a practical solution for reducing uncertainties in the development of front-end electronics for liquid xenon detectors.