[X-ray diagnosis of frontal sinus pathology].

A new variant of X-ray diagnosis for the evaluation of frontal sinus conditions is proposed. The method implies examination of the head positioned so as to have its sagittal plane perpendicular to the table surface, with the central ray directed tangentially to the nasal dorsum and vertically toward the centre of the cassette. Such an arrangement ensures high quality of the image due to the absence of overlapping projections of the adjacent and surrounding facial structures of the skull. Moreover, it eliminates the dependence of visualization results on the age-specific and anatomical cranial features and on the patient's general somatic condition. The radiation load on the patient is also reduced. Thus far, 64 patients have been examined by the proposed method.