Quantification of Magnetic Interactions in van der Waals Heterostructures Using Lorentz Transmission Electron Microscopy and Off-Axis Electron Holography.

Magnetic van der Waals (vdW) materials are promising for memory and logic applications because of their tunable magnetic properties and compatibility with vdW heterostructure devices. However, coupling between magnetic textures in stacked layers is difficult to resolve in conventional plan-view measurements because the magnetic signal is integrated over the sample thickness. Here, these interactions are quantified in Fe3GeTe2 (FGT)/graphite/FGT heterostructures using cross-sectional Lorentz transmission electron microscopy and off-axis electron holography, enabling reconstruction of the local projected magnetic induction within and between the layers. Domain alignment weakens with increasing FGT separation, yielding a stray-field coupling length scale of λ = 37 ± 7  nm for the cross-sectional geometry studied here, corresponding to the average separation at which domain misalignment first emerges. This length scale corresponds to an approximately 23% reduction in the interlayer magnetic induction relative to bulk FGT. The magnetic induction is reduced relative to bulk FGT up to ∼ 100 nm from a surface. Comparisons with model-based iterative reconstructions of the magnetization and micromagnetic simulations show that this near-surface reduction is due to demagnetizing and stray fields. These results quantify the magnetic induction in stacked vdW magnets and guide the design of devices that require controllable coupling between magnetic textures.